供应氧化铈

氧化铈
Cerium oxide 
  
Cas号 【1306-38-3】  MDL:  --MFCD00010933  
Beilstein   EINECS:  --215-150-4 
分子式 CeO2 
分子量 172.11 
别名 二氧化铈，氧化高铈，二氧化铈
Ceric oxide
Ceric oxide, ceria  
分子结构式  
密度：7.3
熔点：2600℃ 
   
备注:  以上描述，仅作参考，并不表示您收到的产品，与此项描述*相符，产品的出厂标准，请参见质量标准。 
质量标准   
  99.95% metals basis，<50 nm particle size (BET):


外观Appearance                          nanopowder 
X-射线衍射分析X-Ray Diffraction         Conforms to standard
纯度Purity                              ≥99.95% Based on Trace Metals Impurities of ICP
粒径Particle size                       <50 nm (BET)
surface area spec. surface area         30 m2/g (BET) 
density                                 7.13 g/mL ， 25 °C
bulk density                            0.53 g/cm3  
痕量金属分析total metallic impurities   ≤500ppm by ICP Atomic emission


99.95% metals basis，<100 nm (BET)

外观Appearance                          nanopowder 
X-射线衍射分析X-Ray Diffraction         Conforms to standard
纯度Purity                              ≥99.95% Based on Trace Metals 
粒径Particle size                       <100 nm (BET)
痕量金属分析total metallic impurities   ≤500ppm by ICP Atomic emission



** metals basis:


外观Appearance                          Yellow to Tan powder 
X-射线衍射分析X-Ray Diffraction         Conforms to standard
纯度Purity                              ≥** Based on Trace Metals Impurities of ICP
ICP Assay                               Confirms  Cerium  component
灼烧损失loss on ignition typically      <1% 
痕量稀土杂质rare earth impurities       ≤200ppm by ICP Atomic emission



20nm 球形，99.5%

外观Appearance                          nanopowder 
X-射线衍射分析X-Ray Diffraction         Conforms to standard
痕量金属分析total metallic impurities   ≤5000ppm by ICP Atomic emission
纯度Purity                              ≥99.5% Based on Trace Metals 
粒径Particle size                       <20 nm (BET)
 
贮存 密封保存。 
用途 *催化剂，精密抛光，化工助剂，电子陶瓷，结构陶瓷，紫外线收剂，电池材料等。  
联合国编号  
Risk：  R22-  
Safety :  S24/25-  
Hazard :  Xn