HP5370B 精密时间间隔通用计数器 厂家:美国惠普 The Agilent 5370B precison time-interval universal counter offers unsurpassed single-shot resolution and a microprocessor-based design for versatile measurement and complete statistical characterization capabilities. The exceptional single shot resolution is achieved by a unique phase-lockable-phase-startable oscillator, used with a digital vernier interpolation scheme that eliminates the ± count quantization error present in most time-interval counters. Statistical functions include mean, maximum, minimum, and standard deviation within the selected sample size. The 5370B allows both positive and negative time interval measurements that are useful for differential phase measurement. Other features include automatic calibration of systematic errors and easy display of triggers. Performance, automation, and ease of use make the 5370B the premier time interval measurement counter for applications in component testing, radar/laser ranging, nuclear systems, calibrations labs, computer peripherals testing, digital communications (jitter analysis), and IC tester verification. 20 ps single-shot least significant digit (LSD) time interval measurement 11 digits/s frequency resolution Up to 8000 measurements/sec Built-in statistics functions Frequency and period to 100MHz HP 5370B Precision and Measurement Speed IC tester performance verification Fast IC characterization Disk drive manufacture Ditital communications-jitter analysis Radar/laser ranging calibration Nuclear systems Calibration labs Full Range of Measurement and Analysis Functions Time Interval:Achieve 20 ps single-shot LSD on time intervals from 0 to 10 s, including negative time (in which the STOP channel event occurs before the START channel event) Frequency:Measure up to 100 MHz with 11 digits of resolution in 1 s. Choose gate times down to 1 period: use 1 period with average mode and access the powerful statistics capabilities Period:Measure period average from 1 to 100 k samples Statistics:Reduce external computations, reduce random errors, and improve measurement throughput Sample size:Select 1, 10, 1 k, 10 k or 100 k samples from the front panel, or 1 to 65,536 samples over HPIB. For the selected sample size, you can compute: Mean Standard Deviation Minimum Maximum Flexible Arming and Gating:+TI or ±TI with internal or external arming, with or without external hold-off Full HP-IB Programming and Fast Data Output: Up to 800 readings/s in fast binary mode - 125 μs dead time 10 to 20 readings/s fully formatted - 330 μs dead time Time Interval Measurement Characteristics Range ±TI:-10 to +10 s, including zero +TI:10 ns to 10 s Resolution:Measurement resolution depends on input ** noise and slew rate. Accuracy:Time-interval measurement accuracy is influenced by internal systematic uncertainties, triggerlevel timing error for each trigger edge, and timebase aging in addition to resolution or random uncertainties. Careful calibration with the HP J06-59992A time interval calibrator and averaging will result in accuracies to ±100 ps. Frequency and Period Measurement Characteristics Range Frequency:0.1 Hz to 100 MHz Period:10 ns to 10 s Resolution:Measurement resolution depends on input ** noise as well as measurement gate time. Accuracy:Accuracy is influenced by internal certainties, timebase againg, and noise on the input **. Periodic timebase calibration minimizes uncertainty due to timebase aging. Internal uncertainties and noise effects may be reduced by selecting longer gate times, or by averaging results.